Scanning Electron Microscope (SEM/EDS)

SEM is a powerful technology for imaging materials with very high resolution down the nanometer level. Imaging in SEM enables magnifications up to 300,000 times.

SEM provides a great depth of field, which makes it possible to study surfaces with strong topography, such as fracture surfaces. The major difference between a SEM and an optical microscope is that a SEM uses electrons instead of light.

We perform analysis of particles, coatings, corrosion products or asbestos fibers with help of the energy dispersive X-ray spectrometer (EDS/EDX).

We carry out research and analysis of:

Asbestos (dust sample, air sample, water sample)
Coatings
Corrosion products
Cracks
Distribution of constituent elements (X-ray mapping)
Environmental samples (e.g. heavy metals)
Fracture surfaces
Material identification (metallic particles, powders, etc)
Paint (e.g. lead, copper)
Surface layer
Phases in microstructure (e.g. brittle phases)
Slag inclusions in macro/micro sample

With our instrument, analyzes can be performed in both high and low vacuum. If the test is performed in a high vacuum, the sample must be electrically conductive, it can be coated with a conductive layer of gold or carbon. In a low vacuum, virtually all samples can be examined and analyzed.

With the help of a line analysis, we can detect variations in the chemical composition over a selected line, which can be advantageously used to analyze surface layers. We can also perform a mapping of the constituent elements and show its distribution and concentration. The results for the above analyzes can be reported as spectrum, in tabular form, graphically and in image format.

Energy dispersive X-ray spectrometer

Our SEM is equipped with an energy-dispersive X-ray spectrometer (EDS/EDX), which gives us the opportunity to chemically analyze the composition both qualitatively and quantitatively on the surface of the area we are investigating, so-called spot check.

Equipment
JEOL-6510A/JSM-6510LA